Archive for January, 2010

Spurgeon’s Abstract Accepted to Spring MRS 2010

Posted in News on January 27th, 2010 by admin – Comments Off on Spurgeon’s Abstract Accepted to Spring MRS 2010

Steven Spurgeon’s abstract, titled “A Multiscale Correlation of the Structural and Magnetic Properties of Complex Metal Oxide Thin Film Composites” has been accepted to the 2010 Spring MRS to be held in San Francisco, CA.

For more information about the meeting, visit: 2010 Spring MRS

Taheri and Colleagues Publish in Ultramicroscopy

Posted in News on January 27th, 2010 by admin – Comments Off on Taheri and Colleagues Publish in Ultramicroscopy

Dr. Taheri’s latest paper, titled “Site-specific atomic scale analysis of solute segregation to a coincidence site lattice grain boundary,” has been published online in the journal Ultramicroscopy.

Abstract: A site-specific method for measuring solute segregation at grain boundaries in an Aluminum alloy is presented. A Σ7(Σ7=38°left angle bracket1 1 1right-pointing angle bracket) grain boundary (GB) in an aluminum alloy (Zr, Cu as main alloying elements) was evaluated using site-specific Local Electrode Atom Probe (LEAP). A sample containing a Σ7 GB was prepared by combining electron backscatter diffraction (EBSD) and focused ion beam (FIB) milling to locate the GB of interest and extract a specimen. Its composition was determined by LEAP, and compared to a general high angle GB (HAGB). Zr was the only alloying element present in the Σ7 GB, whereas the general HAGB contained both Cu and Zr. This site-specific LEAP method was found to be an accurate method for measuring GB segregation at specific GB misorientations. The method has advantages over other methods of measuring chemistry at GBs, such as spectroscopy, in that GB structure can be assessed in three dimensions.

To access the paper, please visit this link: Elsevier

Taheri to speak at American Chemical Society Meeting

Posted in News on January 26th, 2010 by admin – Comments Off on Taheri to speak at American Chemical Society Meeting

Dr. Taheri has been invited to speak at the general meeting of the American Chemical Society’s Delaware Chapter on Wednesday, February 17. Her talk will cover the “Development of the Ultrafast Dynamic Transmission Electron Microscope (DTEM) for the Study of Microstructural Evoluation in Nanostructured Materials.”

For more information about Dr. Taheri’s talk and the upcoming meeting, please see the latest ACS bulletin available at: http://membership.acs.org/d/del/delchemFeb10-2.pdf [PDF]