Frontiers of In Situ Transmission Electron Microscopy Workshop
Location: National Institutes of Technology, Gaithersburg, Maryland
Date: April 11 – 12, 2013
Overview
The significance and versatility of ‘in situ transmission electron microscopy’ techniques has increased exponentially during last ten to 15 years. The stringent processing requirements posed by nanotechnology have stimulated multiple advances in all aspects of TEM instrumentation, including application of external stimulus, high resolution imaging (both spatial and temporal), and image and data capture (camera technology, spectroscopy, etc.). Unfortunately, nearly all of these efforts have generally been made independent of the other, which has been a limitation. The purpose of this workshop is to discuss the current status of these single-focus developments with the intent of understanding how combinations of these advances can be used to tackle key scientific issues in nanoscience and nanotechnology.
In this two day workshop, invited presentations will cover the recent advances and current status of the various aspects of instrumentation as well as delineate future needs. Discussion sessions will focus methods to combine imaging and spectroscopy with high spatial and temporal resolution on a single platform. The outcomes of the workshop will be published in an archived journal and will also be available at the CNST-NIST website.
Organizing Committee
Professor Mitra Taheri
Drexel University – Department of Materials Science and Engineering
Email: Click to reveal
Renu Sharma, Ph.D.
National Institute of Standards and Technology – Center for Nanoscale Science and Technology
Email: Click to reveal
Eric Stach, Ph.D.
Brookhaven National Laboratory – Center for Functional Nanomaterials
Email: Click to reveal
Tentative Program
Invited presentations
Poster sessions (during coffee and lunch breaks)
Panel discussions
Registration and Accommodations
Registration Fee: $250
Registration Deadline: March 1, 2013
Conference Hotel: Hilton Gaithersburg
Nightly Rate: $139 + tax (Reference the NIST in situ TEM workshop rate)